What failure mechanism in electronic components is caused by the slow accumulation of charges within semiconductors due to trapped radiation?
Answer
Total ionizing dose degradation
Total ionizing dose degradation occurs when sensitive electronic components are subjected to prolonged exposure to ionizing radiation, such as that found in the Van Allen radiation belts. Over time, charged particles like protons and electrons deposit energy into semiconductors, causing charges to accumulate within the components. This build-up eventually compromises the electrical characteristics of the semiconductors, leading to gradual loss of function and eventual device failure.
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